Article: Safe and Simple Component Cleanliness

Individual Method Development – On a basis of mutual cooperation, we develop the method of cleanliness check best suitable for your specific purpose.

Improved Component Cleanliness:

Our Single Particle Explorer enables you to rapidly and reliably determine the material composition of foreign particles and, thus, the main sources of contamination.

Custom-Designed Equipment:

We offer you qualified equipment to establish your own test laboratory, from cleaning to particle analysis.

Seamless Method Transfer:

We train your employees in the carrying out of your specific test method, so that you can quickly start on the production of high-quality components again.

Publications:

VALET, O., LANKERS, M., (2008), Automated Imaging Analysis coupled with Raman Identification of 0.5-5000 µm Particles – Particle Explorer, PSA 2008

VALET, O., LANKERS, M., (2008), Higher Yield and Quality through Particle Identification, Journal of the IEST, October 2008

VALET, O., (2006), Automatische Partikelidentifikation - Aufklärung von Mikrometer Kontaminationen ab 500nm, rap-ID Particle Systems GmbH

VALET, O., (2006), Application: Safe and Simple Component Cleanliness, rap.ID Particle Sytems GmbH

VALET, O., LANKERS, M., (2005) Automated Raman Spectroscopy of ambient Aerosols with Airborne Particle Explorer, AAAR 2005

VALET, O., (2002), Made to Measure, Cleanroom Technology, Polygon Media

LANKERS, M., (2002), Determining particle composition: Consider the path to the source, Cleanrooms, PennWell

LEWANS, M., (2001), Fingerprinting particles "automatically” , CleanRooms Magazine, 9

VALET, O., (2001), Woher stammen Partikel, Reinraumtechnik, GIT-Verlag

VALET, O., (2001), Schnelle Materialbestimmung von Mikropartikeln, Laborzeitschrift, GIT-Verlag