“Cleanliness is defined as the contamination level of a component’s surface.” The SPE metal.ID 20 + raman.ID 20 , using remarkable orthogonal spectroscopy analyses, can now identify unknown material, chemical elements, chemical structure, and organic/inorganic particles 20 µm and larger at a throughput rate of 100 - 1000 particles per hour. Inorganic particles cause severe damage and component lifetime reduction, therefore the capability to identify inorganic particles is significant asset . This feature alone could lower warranty costs, decrease failures in the field, maximize customer satisfaction as well as increase output. The device icludes a myriad of other features as well.
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The SPE metal.ID 20 + raman.ID 20 offers documentation and cohesion with quality directives such as ISO 16232, ISO 4406, and VDA 19. These process cleanliness regulations allow you to make critical process capability decisions as well as component cleanliness purchase specifications throughout the entire supply chain. This device pinpoints contamination sources such as manufacture and process generated contamination, thereby leading to meaningful advances in Quality Control.
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